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Featuring a Dewar-based cryogenic architecture and a newly developed Pan-type scanner head, the UHV low-temperature scanning probe microscope system provides a highly stable platform for atomic-scale characterization. The system is compatible with qPlus AFM, also supports a wide range of extensive modules, including optical, magnetic, and electrical measurements, etc. It also enables in-situ sample preparation using MBE and rapid sample transfer between MBE and SPM stage.
Featuring a continuous-flow cryogenic architecture, the UHV variable-temperature scanning probe microscope system can be operated with either liquid helium or liquid nitrogen cooling. The system is compatible with qPlus AFM and supports a wide range of optional modules, including optical, magnetic, electrical measurements, etc. It can also be readily upgraded to a closed-cycle cryogen-free cooling configuration.
ACME (Beijing) Technology
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No. Jia 25, Yanqi South 4th Street, Yanqi Economic Development Area, Huairou District, Beijing 101407, China
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