StillFrost™-5K
Featuring a Dewar-based cryogenic architecture and a newly developed Pan-type scanner head, the UHV low-temperature scanning probe microscope system provides a highly stable platform for atomic-scale characterization. The system is compatible with qPlus AFM, also supports a wide range of extensive modules, including optical, magnetic, and electrical measurements, etc. It also enables in-situ sample preparation using MBE and rapid sample transfer between MBE and SPM stage.
Product Description
MAIN FEATURE
●Two cryogenic options available: traditional wet Dewar (liquid helium Dewar) and closed-cycle helium-free cooling.
●A specially designed scanner significantly enhances optical excitation and collection efficiency, while effectively suppressing laser spot jitter.
●The qPlus sensor offers ultra-low amplitude noise (~2 pm) and an outstanding quality factor of up to 100,000.
●Supports in-situ deposition within the SPM chamber.
●The preparation chamber can be equipped with a liquid helium-cooled five-axis sample stage for low-temperature deposition.
TEST DATA
TECHNICAL DATA
| Temperature Range |
＜5K（Optical port closed） |
|
|
Coarse Range |
X/Y/Z: 3×3×6 mm |
|
|
Scan Range |
X/Y/Z: ≥1.5×1.5×0.4 μm @ ±220 V LT |
|
|
X/Y/Z: ≥4×4×1 μm @ ±220 V RT |
||
|
Resolution |
XY direction:-0.1 nm; Z direction:-0.1 nm |
|
|
Thermal Drift |
Z: ≤100 pm/h @ LT |
|
|
XY: ≤200 pm/h @ LT |
||
|
STM Performance |
Z-axis Vibration: ＜2 pm |
|
|
Minimum Tunneling Current: ≤2 pA（with external preamplifier） |
||
|
Atomic resolution on HOPG and Au(111) |
||
|
AFM Performance |
Atomic resolution on Si(111) and NaCl(100) |
|
|
Amplitude: <10 pm |
||
|
Force sensitivity: < 350fN/Hz1/2 |
||
|
Optical Module |
Aspheric lens:1 or 2 lenses available |
|
|
Numerical Aperture (NA): 0.38 |
||
|
Travel Range: 3×3×3 mm |
||
DIMENSIONS
MAIN FEATURE
●Two cryogenic options available: traditional wet Dewar (liquid helium Dewar) and closed-cycle helium-free cooling.
●A specially designed scanner significantly enhances optical excitation and collection efficiency, while effectively suppressing laser spot jitter.
●The qPlus sensor offers ultra-low amplitude noise (~2 pm) and an outstanding quality factor of up to 100,000.
●Supports in-situ deposition within the SPM chamber.
●The preparation chamber can be equipped with a liquid helium-cooled five-axis sample stage for low-temperature deposition.
TEST DATA
TECHNICAL DATA
| Temperature Range |
＜5K（Optical port closed） |
|
|
Coarse Range |
X/Y/Z: 4×4×8 mm |
|
|
Scan Range |
X/Y/Z: ≥1.5×1.5×0.4 μm @ ±220 V LT |
|
|
X/Y/Z: ≥4×4×1 μm @ ±220 V RT |
||
|
Resolution |
XY direction:-0.1 nm Z direction:-0.1 nm |
|
|
Thermal Drift |
Z: ≤100 pm/h @ LT |
|
|
XY: ≤200 pm/h @ LT |
||
|
STM Performance |
Z-axis Vibration: ＜2 pm |
|
|
Minimum Tunneling Current: ≤2 pA（with external preamplifier） |
||
|
Atomic resolution on HOPG and Au(111) |
||
|
AFM Performance |
Atomic resolution on Si(111) and NaCl(100) |
|
|
Amplitude: <10 pm |
||
|
Force sensitivity: < 350fN/Hz1/2 |
||
|
Optical Module |
Aspheric lens:1 or 2 lenses available |
|
|
Numerical Aperture (NA): 0.38 |
||
|
Travel Range: 3×3×3 mm |
||
DIMENSIONS
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