Product Description
MAIN FEATURE
●Two cryogenic options available: traditional wet Dewar (liquid helium Dewar) and closed-cycle helium-free cooling.
●A specially designed scanner significantly enhances optical excitation and collection efficiency, while effectively suppressing laser spot jitter.
●The qPlus sensor offers ultra-low amplitude noise (~2 pm) and an outstanding quality factor of up to 100,000.
●Supports in-situ deposition within the SPM chamber.
●The preparation chamber can be equipped with a liquid helium-cooled five-axis sample stage for low-temperature deposition.
TEST DATA

TECHNICAL DATA
Temperature Range | Wet Dewar (liquid helium Dewar) Cooling | <4K(Optical port closed) |
Closed-cycle helium-free cooling | <5K(Optical port closed) | |
Coarse Range | X/Y/Z: 4×4×8 mm | |
Scan Range | X/Y/Z: ≥1.5×1.5×0.4 μm @ ±220 V LT | |
X/Y/Z: ≥4×4×1 μm @ ±220 V RT | ||
Resolution | XY direction:-0.1 nm; Z direction:-0.1 nm | |
Thermal Drift | Z: ≤100 pm/h @ LT | |
XY: ≤200 pm/h @ LT | ||
STM Performance | Z-axis Vibration: <2 pm | |
Minimum Tunneling Current: ≤2 pA(with external preamplifier) | ||
Atomic resolution on HOPG and Au(111) | ||
AFM Performance | Atomic resolution on Si(111) and NaCl(100) | |
Amplitude: <10 pm | ||
Force sensitivity: < 350fN/Hz1/2 | ||
Optical Module | Aspheric lens:1 or 2 lenses available | |
Numerical Aperture (NA): 0.38 | ||
Travel Range: 3×3×3 mm | ||
DIMENSIONS

● SPM System Footprint: 2.3 × 2.1 m²
● SPM Cabinet: 1.1 × 0.65 m² (per cabinet)
● Helium Closed-Cycle Liquefaction System:
- Liquefaction Unit: 0.9 × 0.65 m²
- Compressor: 0.5 × 0.5 m²
● Split-Type Water Chiller:
- Indoor Unit: approx. 1 × 1 m²
- Outdoor Unit: approx. 1.5 × 1 m²
MAIN FEATURE
●Two cryogenic options available: traditional wet Dewar (liquid helium Dewar) and closed-cycle helium-free cooling.
●A specially designed scanner significantly enhances optical excitation and collection efficiency, while effectively suppressing laser spot jitter.
●The qPlus sensor offers ultra-low amplitude noise (~2 pm) and an outstanding quality factor of up to 100,000.
●Supports in-situ deposition within the SPM chamber.
●The preparation chamber can be equipped with a liquid helium-cooled five-axis sample stage for low-temperature deposition.
TEST DATA

TECHNICAL DATA
Temperature Range | Wet Dewar (liquid helium Dewar) Cooling | <4K(Optical port closed) |
Closed-cycle helium-free cooling | <5K(Optical port closed) | |
Coarse Range | X/Y/Z: 4×4×8 mm | |
Scan Range | X/Y/Z: ≥1.5×1.5×0.4 μm @ ±220 V LT | |
X/Y/Z: ≥4×4×1 μm @ ±220 V RT | ||
Resolution | XY direction:-0.1 nm Z direction:-0.1 nm | |
Thermal Drift | Z: ≤100 pm/h @ LT | |
XY: ≤200 pm/h @ LT | ||
STM Performance | Z-axis Vibration: <2 pm | |
Minimum Tunneling Current: ≤2 pA(with external preamplifier) | ||
Atomic resolution on HOPG and Au(111) | ||
AFM Performance | Atomic resolution on Si(111) and NaCl(100) | |
Amplitude: <10 pm | ||
Force sensitivity: < 350fN/Hz1/2 | ||
Optical Module | Aspheric lens:1 or 2 lenses available | |
Numerical Aperture (NA): 0.38 | ||
Travel Range: 3×3×3 mm | ||
DIMENSIONS

● SPM System Footprint: 2.3 × 2.1 m²
● SPM Cabinet: 1.1 × 0.65 m² (per cabinet)
● Helium Closed-Cycle Liquefaction System:
- Liquefaction Unit: 0.9 × 0.65 m²
- Compressor: 0.5 × 0.5 m²
● Split-Type Water Chiller:
- Indoor Unit: approx. 1 × 1 m²
- Outdoor Unit: approx. 1.5 × 1 m²
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