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Featuring a Dewar-based cryogenic architecture and a newly developed Pan-type scanner head, the UHV low-temperature scanning probe microscope system provides a highly stable platform for atomic-scale characterization. The system is compatible with qPlus AFM, also supports a wide range of extensive modules, including optical, magnetic, and electrical measurements, etc. It also enables in-situ sample preparation using MBE and rapid sample transfer between MBE and SPM stage.
三温区裂解源
ACME (Beijing) Technology
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No. Jia 25, Yanqi South 4th Street, Yanqi Economic Development Area, Huairou District, Beijing 101407, China
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